Making sub-micron measurements cheaper.

BTBP 3D Clarity Metrology with dark field microscope

Our software can be added to any dark field microscope. With our analysis tools you can create detailed 3D or 2D maps(depending on lighting). When combined with our virtual measurement tools you can find the sizes and volume of things you never thought possible.

One microscope with all the routine imaging modes BF, DF, DIC, POL, OBLIQUE, NIR & FL Plus a Smart-Scope with the next 3 steps in microscopy

  • Nanometer scale 3D surface imaging and measurements
  • Artificial Intelligence to perform defect analytics
  • Multi-microscope unification and data mining to build a useful library of information.

100X objective
3µ microns line width
Height <1µ micron

Applications Gallery


Out performs other systems in the market

Z resolution better than 2 nm

Spatial resolution camera and optics dependent, 50x objective less than half a micron.

Works with consumer cameras and optics

Insensitive to DOF variation

Lowest cost